Performance of dihaploid wheat lines obtained via anther culture
DOI:
https://doi.org/10.1590/S0103-90162003000100007Keywords:
grain yield, 100 grain weight, plant height, lodging, tolerance to aluminumAbstract
The anther culture technique has been used in breeding programs to obtain haploid plants from hybrid plants of F1 generation and to develop more efficiently wheat cultivars. To study the behavior of dihaploid wheat lines and two check cultivars, IAC-24 and IAC-289, experiments were carried out under sprinkler irrigation at Monte Alegre do Sul, SP, Brazil, in an Haplic Acrisol and at Tatuí, SP, Brazil, in a Rhodic Ferrasol, during the years 1999 and 2000. Genotypes were evaluated for grain yield, 100 grain weight, plant height, resistance to leaf rust (Puccinia recondita f. sp. tritici Rob. Desm.) and lodging. The genotypes were also evaluated under laboratory conditions for their Al+3 toxicity tolerance using nutrient solutions. The line 8, originated from ANA/IAC-24 cross, presented high grain yield, semidwarf plant type, heavy grain, leaf rust resistance and tolerance to Al+3 toxicity. The lines 4, 11, 12 and 14, also presented high tolerance to Al+3 toxicity in association to grain yield above 3.000 kg ha-1. These lines are suitable to be used in breeding programs to develop cultivars for acid soils.Downloads
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Published
2003-02-01
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Crop Science
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All content of the journal, except where identified, is licensed under a Creative Common attribution-type BY-NC.How to Cite
Performance of dihaploid wheat lines obtained via anther culture . (2003). Scientia Agricola, 60(1), 43-50. https://doi.org/10.1590/S0103-90162003000100007