Hyperspectral field reflectance measurements to estimate wheat grain yield and plant height . Scientia Agricola, [S. l.], v. 63, n. 2, p. 130–138, 2006. DOI: 10.1590/S0103-90162006000200004. Disponível em: https://revistas.usp.br/sa/article/view/22145.. Acesso em: 29 jun. 2024.